2019,Volume 1, Issue 5 (DOI 10.37681/2181-9947-2019-5) |
SEMICONDUCTOR PHYSICS |
STATE OF RESEARCH AND PROSPECTS OF DEVELOPMENT OF SEMICONDUCTOR MULTILAYER HETEROSTRUCTURES BASED ON Si (Review)FEATURES OF THE CURRENT-VOLTAGE CHARACTERISTIC OF n-GaPp-(InSb)1-x(Sn2)x HETEROSTRUCTUREINFLUENCE OF LOW-TEMPERATURE TREATMENTS ON THE BEHAVIOR OF DEEP LEVELS IN SILICON DOPED WITH PLATINUM |
SEMICONDUCTOR MICROELECTRONICS |
DIGITAL HOLOGRAPHIC INTERFEROMETRY IN PHYSICAL MEASUREMENTSTHREE-BARRIER Au/AlGaAs(n)/GaAs(p)/Ag PHOTODIODE STRUCTURESTHE FLOW SENSORS OF A CONTINUOUS MEDIUMA NEW KIND OF VOLTAGE AMPLIFIER ON THE FIELD-EFFECT TRANSISTOR WITH DYNAMIC LOAD |
SEMICONDUCTOR MATERIALS SCIENCE |
INCREASING THE THERMAL STABILITY OF SILICON IN THE FORMATION OF CLUSTERS OF IMPURITY NICKEL ATOMS |
RADIATION SEMICONDUCTOR PHYSICS |
RADIATION AND THERMAL DEFECT FORMATION IN SILICON MIS - STRUCTURES WITH IMPURITIES OF REFRACTORY ELEMENTS |